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October 13th, 2008 - we have
237 poets
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Search: john j friel
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1.
Amazon.com's Price:
$167.00
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Practical Guide to Image Analysis
by:
John J. Friel
January 15, 2000
2.
Amazon.com's Price:
$5.95
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Compositional imaging: the SEM with spectrum imaging has become a tool of materials characterization beyond its value for high resolution and depth of ... article from: Advanced Materials & Processes
by:
John J. Friel
August 01, 2005
3.
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Advances in X-ray microanalysis.: An article from: Advanced Materials & Processes
by:
John J. Friel
,
Victor A. Greenhut
July 28, 2005
4.
Developments in Materials Characterization Technologies: Symposium Held 23 and 24 July 1995, During the 28th Annual Technical Meeting of the International ... Society, Albuquerque, New Mexico, usa
from: International Metallographic Society1996-09
5.
X-ray microanalysis and computer-aided imaging
by:
John J Friel
1990
6.
Microbeam Analysis: Proceedings of the 28th Annual Mas Meeting : New Orleans, LA July 31-August 5, 1994 (Microbeam Analysis)
from: Vch Pub1994-07
7.
X-Ray and Image Analysis in Electron Microscopy
by:
John J. Friel
2004-01
page 1 of 1
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Copyright © 2000-2008 Gunnar Bengtsson. All Rights Reserved.
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by: John J. Friel
January 15, 2000