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by: Paul F. Fewster
Amazon.com's Price: $99.00 Prices subject to change. Availability: Usually ships in 24 hours
Binding: Hardcover
Dewey Decimal Number: 539
EAN: 9781860943607
ISBN: 1860943608
Label: Imperial College Press
Manufacturer: Imperial College Press
Number Of Items: 1
Number Of Pages: 316
Publication Date: 2003-09
Publisher: Imperial College Press
Sales Rank: 1410779
Studio: Imperial College Press
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Editorial Review:
Product Description:
A practical guide to the analysis of materials, including a description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection. The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis should become significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces. A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented.
Customer Reviews
Average Rating: 
Rating: - Poor
This isn't a very good text, especially for anyone new to the field. The quality of some of the diagrams/figures is third rate (to say the least). There are frequent mistakes in derivations and equations.
Nicholas, Research Fellow (Physics)
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