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by: Ulrich Pietsch, Vaclav Holy, Tilo Baumbach
List Price: $135.00Amazon.com's Price: $98.55 You Save: $36.45 (27%)Prices subject to change. Availability: Usually ships in 24 hours
Binding: Hardcover
Dewey Decimal Number: 530.4175
EAN: 9780387400921
ISBN: 0387400923
Label: Springer
Manufacturer: Springer
Number Of Items: 1
Number Of Pages: 408
Publication Date: August 27, 2004
Publisher: Springer
Sales Rank: 1179384
Studio: Springer
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Product Description:
The book presents a detailed description of high-resolution x-ray scattering methods suitable for the investigation of the real structure of single-crystalline layers and multilayers, including structure defects in the layers and at the interfaces. Particular attention is devoted to lateral structures in semiconductors and semiconductor multilayers such as quantum wires and quantum dots. Both the theoretical background and the application of the methods are discussed. The second edition is extended to deal with lateral surface nanostructures such as gratings and dots, new examples for measuring layer thickness, lattice mismatch, and surface/interface roughness. The book will be an invaluable source for graduates and scientists.
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